JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working img{max-width:100%} img{max-width:100%} Lam Research 716-800842-005

img{max-width:100%} img{max-width:100%} Lam Research 716-800842-005 Foc

Estimated Packed Shipping Dimensions: L x W x H = 28"x18"x18" @ 57 lbs

Inventory # AA-3790

Part No: 0033116-001

img{max-width:100%} ASM Advanced Semiconductor Materials 2334801-21 Processor PCB Card Rev

JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working img{max-width:100%} img{max-width:100%} Lam Research 716-800842-005JEOL Column Electron Detector Assembly JWS 2000 Wafer Defect Review SEM Working Part No: Electron Detector Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Detector Assembly is working surplus. Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling. Sale Details Item